理论强度公式在X-射线荧光光谱分析中的应用  

Application of Theoretical Intensity Formulas to X-Ray Fluorescence Analysis

作　　者：王桂华[1] 谭秉和[1] 

机构地区：[1]北京科技大学化学系,北京100083

出　　处：《光谱学与光谱分析》2002年第2期328-330,共3页Spectroscopy and Spectral Analysis

摘　　要：介绍理论强度公式的应用 :计算基体效应 ,估算三次荧光 ;标准样品数据及实验条件的检验 ;预测标样的适用性 ;稀释率的确定。The applications of the theoretical formulas of the X-ray fluorescent intensities (primary, secondary. tertiary) are illustrated. The matrix effects (absorption and enhancement effects) are evaluated, the data of standard samples and experimental conditions are checked, the forecast of suitability of standard samples for calibration curve and the determination of the dilution of the glass disc are made.

关 键 词：理论强度公式 X-射线荧光光谱分析 应用 基体效应 标样预测 玻璃熔片 稀释率 

分 类 号：O657.34[理学—分析化学]