桥接故障的物理提取和高效测试  

Physical Extraction and Efficient Test for Bridging Faults

作　　者：韦素芬[1] 

机构地区：[1]集美大学信息工程学院,福建厦门361021

出　　处：《集美大学学报（自然科学版）》2014年第4期314-320,共7页Journal of Jimei University：Natural Science

基　　金：福建省科技计划重点项目(2013H0035);集美大学李尚大学科建设基金项目

摘　　要：为桥接故障候选点建立7种基于版图的物理模型,给出提取故障候选点的方法.为了更有效地利用芯片设计周期,减少测试图形数量,提出一种以确定性桥接故障测试为主体,有效结合内置多重固定测试的综合型测试方法.用90 nm的两个芯片进行自动测试图形生成和验证,从生成测试图形的时间长度、测试图形的数量、桥接故障测试覆盖率3个主要方面来对比,验证了该综合型测试方法的有效性.This paper defines 7 physical models for deterministic bridge fault ATPG and verification by extracting the most probable bridging faults candidates based upon proximity of lines and via. It also presents the extraction method for fault candidates. To make full use of the design cycle, and reduce test patterns, an efficient test methodology is introduced. It is an integrated solution, and the main procedure is deterministic bridge fault test, combining the advantages of EMD fault ATPG. The details of the method are discussed a- long with ATPG results for two 90 nm ICs. By comparing experimental results from ATPG of different meth- ods, we demonstrate that the proposed method can achieve shorter ATPG time, smaller test pattern volume, and higher bridging fault test coverage.

关 键 词：桥接故障 故障候选点 确定性桥接故障 测试覆盖率 

分 类 号：TN407[电子电信—微电子学与固体电子学] TP391.7[自动化与计算机技术—计算机应用技术]