半导体测试仪器故障诊断技术研究  

A Research on Fault Diagnosis Technology of Semiconductor Test Instruments

作　　者：何林[1] 蔡明理[1] 

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《微电子学》2014年第3期395-397,412,共4页Microelectronics

摘　　要：对半导体测试仪器故障诊断方法学和故障定位实用方法进行了初步研究。故障诊断是模式分类和识别结合维修经验的一种重复过程。在简述常用的诊断方法和故障定位技术基础上,用实例探讨了在半导体测试仪器维护实践中运用诊断理论的技巧。A preliminary investigation on fault diagnostic methodology and fault location practical methods of semiconductor test instruments is given.A conclusion that the fault diagnosis technology is a kind of reiterating process in which patten classification and recognition is combined with the experience of maintaining is reached.On the basis of having simple describing a set of fault diagnosis methodology and fault location technique,we introduce some skills about this theme of fault diagnosis with a practical application of diagnostic theories in the process of service of semiconductor test instruments.

关 键 词：半导体测试仪器 故障诊断 模式识别 

分 类 号：TN407[电子电信—微电子学与固体电子学]