ZnGeP_2晶体轴向成分均匀性的XPS分析  

Analysis of the Axial Composition Homogeneity of ZnGeP_2 Crystals by XPS

作　　者：陈成[1] 朱世富[1] 赵北君[1] 陈宝军[1] 何知宇[1] 杨登辉[1] 曹礼强[1] 刘伟[1] 

机构地区：[1]四川大学材料科学系,成都610064

出　　处：《人工晶体学报》2014年第6期1341-1345,共5页Journal of Synthetic Crystals

基　　金：国家自然科学基金重点项目(50732005)

摘　　要：通过改进ZnGeP2晶体的合成和生长工艺,获得了尺寸为24 mm×60 mm的ZnGeP2单晶体。采用X射线光电子能谱（XPS）对生长出的晶体轴向成分进行了分析。结果表明,晶体在籽晶、放肩和主体部分成分一致,在尾部存在X射线衍射（XRD）未能检测出的极少量的P和Ge的氧化物,说明生长出的ZnGeP2单晶体的轴向成分比较均匀。红外透过率测试显示,晶体的轴向各部分在3~8μm波长范围内透过率均在56%以上,而尾部在近红外波段（1.3~2.6μm）的吸收明显要高于其他各部分。The synthesis and growth process of ZnGeP2crystals were improved,and an integral ZnGeP2single crystal with size of 24 mm × 60 mm was obtained.XPS was used to analyze the axial composition of the grown ZnGeP2single crystal.The results indicate that the chemical composition was homogeneity in the seed,the shoulder and the main part of the crystal,while the tail of the crystal contained a minimal amount of impurities P and Ge,which the XRD analysis did not detected on the mentioned condition.The XPS analysis demonstrate the crystal had good composition homogeneity along the axis.The IR transmission spectra showed that the infrared transmittance of the four parts exceeds 56% in the range of3-8 μm,while the optical absorption of the tail in the region of 1.3-2.6 μm is higher than others.

关 键 词：磷锗锌 轴向成分 均匀性 透过率 

分 类 号：TN213[电子电信—物理电子学]