基于LBIST的纠检错电路验证方法与实现  

Verification Methodology and Implement Ation of EDAC Circuit Based on LBIST

作　　者：崔媛媛[1] 李振辉[1] 张洵颖[1] 

机构地区：[1]西安微电子技术研究所,西安710054

出　　处：《计算机测量与控制》2014年第7期2146-2147,2153,共3页Computer Measurement &Control

基　　金：十二五核高基项目(2011AA120201)

摘　　要：基于逻辑内建自测试的设计原理,提出了一种针对纠检错电路进行功能自测试的方法,根据纠检错电路具有固定纠检错能力的特点,无需存储海量的比较数据,也不需要设计响应特征分析器对结果数据进行压缩处理,针对具体的纠检错电路,通过增加特别设计的注错逻辑可实现任意类型的故障注入,并根据注错信息可对结果进行预测,通过与预期结果比较,可达到验证的目的;最后,以(40,32)海明编码与解码电路为例,实现了其功能自测试结构,并对所有240-1种故障进行了注入与验证;结果表明使用本文的验证方法,可实现纠检错电路的自动化随机验证。Based on design principle of the logic built-in self-test, a verification method of the error detection and correction circuit self -test is developed. As EDAC circuit having fixed EDAC ability, a large amount of compared data need not be stored, response signature analyzer used to compressing results is not required to be designed. By specially designing fault injector, an EDAC circuit can realize any type of fault injection. According to information of the fault injeetion, the result can be predicted. In order to detect correctness, the outputs from the EDAC circuit can be compared with the expected results. Finally, take a （40, 32） Hamming circuit for example, its strueture of function self-tests can be realized, and all 2^40- 1 faults are injected. The conclusion indicates that the proposed technique can implement automatic random verification.

关 键 词：逻辑内建自测试 纠检错电路 故障注入 单粒子翻转 线性反馈移位寄存器 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构]