MEMS F-P干涉型压力传感器  被引量:15

MEMS F-P interferometry pressure sensor

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作  者:江小峰[1] 林春[1] 谢海鹤[1] 黄元庆[1] 颜黄苹[1] 

机构地区:[1]厦门大学物理机电学院,福建厦门361005

出  处:《红外与激光工程》2014年第7期2257-2262,共6页Infrared and Laser Engineering

基  金:福建省自然科学基金(2013J01251)

摘  要:为了满足工业、航天、国防等领域对微型化压力传感器的需求,提出了基于微机电系统(MEMS,Micro electromechanical System)技术制作的非本征型光纤法布里-珀罗(F-P)压力传感器,该传感器传感头由全玻璃材料构成。主要研究了MEMS技术制作全玻璃结构式压力传感器工艺,结合溅射、光刻、腐蚀等工艺在7740 wafer基底上制作出F-P腔体,利用低压化学气相沉积(LPCVD)的方法在基底上沉积一层40 nm的非晶硅作为中间层。通过阳极键合技术在温度400℃下完成玻璃与玻璃的键合,并搭建了该传感器的压力测量平台。实验结果表明:在压力线性范围0-400 kPa内传感器具有很高的重复性,达到0.3%。灵敏度达到1.764 nm/kPa;在传感器使用范围0-80℃内,热敏感系数为0.15 nm/℃。该传感器的研究对设计制作改善了该类传感器的热膨胀失配问题,对低温漂型压力传感器的研究有一定参考价值。In order to meet the requirements of industry, aerospace and defense for miniature pressure sensors, an optical F-P interferometry pressure sensor which was made from all-glass material was presented, the sensor head of which was made from all-glass material. The processing steps of MEMS craft for fabrication of the all-glass optical pressure sensor were studied mainly , F-P cavity was made on 7 740 wafer based on sputtering, photolithography and etching technology, a 40 nm thick amorphous silicon layer deposited by low-pressure chemical vapor deposition (LPCVD) on this wafer was used as an intermediate layer. Then glass-to-glass anodic bonding was finished under the temperature of 380° . Finally, the pressure measurement system was established. The experiment result shows that a high repeatability in the range of 0-400 kPa pressure and a reasonable sensitivity of 1 . 764 nm/kPa have been obtained in this pressure sensor . The temperature-sensitivity coefficient of the sensor was about 0 . 15 nm/℃ in the range of 0-80℃. The study of the pressure sensor would be of utility value for design and fabrication of low temperature drift typed pressure sensor.

关 键 词:光纤传感器 MEMS 全玻璃材料 F—P腔制作 

分 类 号:TP394.1[自动化与计算机技术—计算机应用技术] TH691.9[自动化与计算机技术—计算机科学与技术]

 

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