场发射透射电子显微镜及能谱功能开发  

Function Development of Field Emission Transmission Electron Microscope and Energy Dispersive Spectrometer

作　　者：高峰[1] 李智丽[1] 杨维宇[1] 

机构地区：[1]内蒙古包钢钢联股份有限公司技术中心,内蒙古包头014010

出　　处：《包钢科技》2014年第4期42-45,共4页Science & Technology of Baotou Steel

摘　　要：文章简述了Tecnai G2 F20场发射透射电子显微镜的组成和基本参数,并详细说明了该透射电镜和能谱的功能开发,主要有:TEM+EDS功能、HTEM功能、STEM+EDX点、线、面扫描功能、STEM高分辨功能,并举例说明此设备在产品开发中的应用。In the paper,it is briefly described the composition and basic parameters of Tecnai G2 F20 transmission electron microscope（TEM） as well as illustrated the function development of the transmission electron microscope and energy dispersive spectrometer in detail. The main functions include TEM ＋ EDS, HTEM, scan of point,line and plane for STEM ＋ EDX as well as high resolution of STEM. Moreover,its applications in product development are illustrated.

关 键 词：透射电镜 STEM 析出物 微观分析 

分 类 号：TN16[电子电信—物理电子学]