InGaAs PIN光电探测器的加速老化研究  

Accelerated Aging of InGaAs PIN Photoelectric Detectors

作　　者：金露凡 张雅婷[1,2,3] 王海艳[1,2,3] 王茂榕[1,2,3] 宋效先[1,2,3] 姚建铨[1,2,3] 

机构地区：[1]天津大学精仪学院 [2]天津大学激光与光电子研究所,天津300072 [3]天津大学光电信息技术科学教育部重点实验室,天津300072

出　　处：《中国激光》2014年第10期188-193,共6页Chinese Journal of Lasers

基　　金：天津大学自主创新基金(60302070)

摘　　要：InGaAs PIN光电探测器在空间遥感、卫星通讯等方面有着广泛的应用。利用358K恒温加速老化实验研究探测器长时间稳定工作时输出电信号噪声的演化规律,并在此基础上,通过对比老化前后探测器的线性区及其噪声温度特性,讨论了探测器在长期工作过程中的失效情况。结果表明,在连续工作大约10.8年后,探测器本底噪声中热噪声增加了约20%,暗电流噪声增大了约0.35%。探测器的线性区范围下降了约10%。得到因长期工作而修正的探测器噪声模型。The InGaAs PIN photoelectric detector has great value in fields of spatial remote sensing and satellite communication.Evolvement rules of the output electrical signal noise are studied with the experiment of accelerated aging at constant temperature 358 K when the detector operates stably in a long term.And on this basis,failure analysis of the detector working in long-term is discussed by comparison with the fore-and-aft linear region and temperature property of its noise.The theoretical results indicate that after operating stably in about 10.8 years,thermal noise of the detector′s background noise will increase about 20%,and dark current noise about 0.35%.For the linear region of two detectors 13.31% and 9.95% are declined.Furthermore,the output noise model is modificated according to the analysis and the results of the experiments.

关 键 词：探测器 INGAAS PIN 加速老化 噪声 温度 

分 类 号：TN215[电子电信—物理电子学]