不同抛光处理对粘结托槽的瓷表面粗糙度影响的体外研究  

Different polishing treatment on the bonding slot porcelain surface roughness effect in vitro studies

作　　者：陈启林[1] 胡孝丽[1] 严艳[1] 马国平 

机构地区：[1]湖北医药学院附属太和医院口腔科,湖北十堰442000 [2]上海市浦东新区周浦医院,上海201318

出　　处：《临床口腔医学杂志》2014年第11期651-652,共2页Journal of Clinical Stomatology

基　　金：十堰市科技局科学技术研究与开发项目(ZD2011019);湖北省科技厅面上项目(2012FFB3902)

摘　　要：目的:探讨不同抛光处理方法对烤瓷表面粘结的托槽去除后,瓷表面抛光后粗糙度的影响。方法:采用不同方法粘结托槽:A组(氢氟酸+陶瓷偶联剂+釉质粘结剂);B组(氢氟酸+釉质粘结剂);C组(陶瓷偶联剂+釉质粘结剂)。烤瓷片表面不同方法粘结托槽经剪切去除后,测定瓷面采用不同步骤抛光处理前后及对照组的瓷片表面粗糙度值。结果:抛光前A、B组间差异无统计学意义(P>0.05),C组小于A、B组,差异有统计学意义(P<0.05);抛光过程中各组间差异无统计学意义(P>0.05);各组抛光前后比较差异有统计学意义(P<0.01);抛光后各组间比较差异无统计学意义(P>0.05),都达到了对照组水平(P>0.05)。结论:机械打磨、氢氟酸、陶瓷偶联剂对瓷表面粗糙度的影响依次递减,抛光套装依序抛光对降低表面粗糙度行之有效,抛光后能使托槽去除后瓷表面粗糙度达到对照组水平。Objective：To study the different polishing processing method on the porcelain surface bonding braces are removed,the influence of porcelain surface roughness after polishing. Method：Group and different treatment：group A（hy-drofluoric acid＋ceramic coupling agent ＋ enamel adhesive）;Group B（hydrofluoric acid ＋ enamel adhesive）;Group C（ce-ramic coupling agent ＋ enamel adhesive）. PFM different methods for surface bonding slot after shear removal,determination of porcelain face different steps before and after polishing processing and surface roughness value of the control group. Re-sult：Polishing before A,B group no difference （P 〉0.05）,less than A,B group C group （P 〈0.05）;Polishing process of no difference between groups（P〉0.05）;Each group before and after polishing is significant difference（P〈0.01）;After polishing compared each group no difference（P〉0.05）,at the level of control group（P〉0.05）. Conclusion：Mechanical grinding, hy-drofluoric acid,the ceramic coupling agent affect surface roughness reduce one,porcelain polishing suit and polishing in or-der to reduce the surface roughness,effective after polishing can make braces are removed porcelain surface roughness in the control group.

关 键 词：抛光 瓷表面 表面粗糙度 

分 类 号：R783.2[医药卫生—口腔医学]