内嵌于DDS高速DAC的动态参数测试  

Dynamic Parameter Test of High-speed DAC Embedded in DDS

作　　者：张凯虹[1] 陈真 王建超 

机构地区：[1]中国电子科技集团公司第58研究所,江苏无锡214035 [2]江南大学物联网学院,江苏无锡214122

出　　处：《电子与封装》2015年第2期16-18,共3页Electronics & Packaging

摘　　要：对基于ATE和频谱仪的内嵌于DDS的高速DAC的动态参数进行测试实验,通过编程由ATE提供数字正弦波和时钟信号;通过频谱仪对DAC输出模拟信号采样,并通过VBT编程得到DAC的动态参数。最后将结果返回到ATE的Excel环境下与其他测试参数结果一起输出。整个流程由ATE主机控制,避免了芯片的二次测试,缩减了测试成本,实验证明在实际应用中该方法有很好的效果。Using ATE and spectrometer, experiments are conducted to test dynamic parameters of high-speed DAC embedded in DDS. The ATE provides clock and digital sine waves with frequency for the DAC by programming. The spectrometer samples output analog singals of the DAC and obtains dynamic parameters by VBT program. At last the result will return to ATE and print with other parameters in Excel. The whole process is controlled by the ATE host. To avoid the chip test twice, reduce the test cost. The experiments demonstrate that the method can achieve good result in actual application.

关 键 词：数字模拟转换器 动态参数测试 直接数字频率合成 

分 类 号：TN407[电子电信—微电子学与固体电子学]