Quantum integrated circuit： classical characterization  

作　　者：Jin-Shi Xu Chuan-Feng Li 

机构地区：[1]Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China

出　　处：《Science Bulletin》2015年第1期141-141,共1页科学通报（英文版）

摘　　要：Quantum technologies promise a safer and faster life for us. One of the difficulties in developing quantum technologies is the scalability of quantum devices. Integrated quantum circuits based on waveguide networks fabricated by direct laser writing have become an attractive subject [1]. How- ever, for the N-input and N-output （N × N） integrated quantum circuit, the characterization of the operators becomes a hard problem when N is large. The measure- ment settings for the traditional quantum process tomog- raphy would exponentially increase with N.

关 键 词：量子器件 集成电路 表征 过程层析成象 量子电路 可扩展性 网络集成 激光直写 

分 类 号：TN201[电子电信—物理电子学] TN402