一种测量薄膜电阻器微弱噪声的放大电路设计  

Design of amplifier circuit to measure weak noise in thin-film resistor

作　　者：吴晟[1] 梁津津[1] 兰卉[1] 刘宁[1] 

机构地区：[1]国家海洋技术中心,天津300112

出　　处：《电子元件与材料》2015年第3期62-66,共5页Electronic Components And Materials

基　　金：国家自然科学基金资助项目(No.41206031);天津科技兴海资助项目(No.2014-14)

摘　　要：针对薄膜电阻器微弱噪声信号的检测,设计了一种实用化的基于AD797集成运放芯片的低噪声放大电路。同时,在电路形式设计和器件选择两方面论述了放大电路设计要点,并在实验和理论的基础上分别进行了电路性能的验证和探测下限的讨论。实验结果表明:电路在10 Hz^10 MHz宽频带内的放大增益为1 210倍;电路在100Hz输出的噪声功率谱密度仅为3.12×10–18 V2·Hz–1。In view of the measurement for the weak noise signal in thin-film resistor, a practical and low noise amplifier circuit of weak noise signal detection was designed. It was based on AD797 ultralow noise operational amplifier. The essentials of this circuit design were described from the aspects of the circuit form and device selection. At the same time, the performances of amplifier circuit were validated based on the experiment and the detection limit were discussed based on the theory respectively. The experimental results indicate that： the gain of this amplifier circuit is 1 210 in the wide frequency range of 10 Hz-10 MHz; the noise power spectral density at 100 Hz is only about 3.12×10^-18 V^2· Hz^-l.

关 键 词：薄膜电阻器 微弱信号 放大电路 噪声测量 热噪声 1/f噪声 

分 类 号：TM544[电气工程—电器] TN721[电子电信—电路与系统]