基于运行模式切换的低不匹配误差高动态范围CMOS智能温度传感器  

A Low Mismatch Error and High Dynamic Range CMOS Smart Temperature Sensor Based on Operational Modes Switching

作　　者：单文焘 张培勇[1] 冯忱晖[1] 

机构地区：[1]浙江大学超大规模集成电路研究所,杭州310027

出　　处：《传感技术学报》2015年第1期142-147,共6页Chinese Journal of Sensors and Actuators

基　　金：国家自然科学基金项目(61204111;61474098)

摘　　要：提出了一种新的电路结构,通过两种运行模式的切换,可以在降低CMOS智能温度传感器不匹配误差的同时,保证输出有尽可能高的动态范围。理论分析得出,相对于传统结构,新结构的不匹配误差能减小66%以上。0.18μm工艺环境下的仿真结果表明,在-55℃~125℃的温度范围内,输出能达到90%左右的动态范围,和Pertijs提出的改进结构相比,有较大幅度的提高。芯片实测结果在-10℃~100℃的温度范围内证实了这个结论。A new circuit structure which can switch between two operational modes is proposed to reduce the mismatch errors of CMOS smart temperature sensors and ensure a high dynamic range of the output. The new structure can reduce more than 66% of the mismatch error in contrast to traditional circuit by theoretical analysis. The simulation between-55 ℃ and 125 ℃ based on 0.18 μm process shows that a dynamic range of about 90% which is larger than the output of Pertijs＇ structure can be acquired using this new structure. This conclusion is verified by chip testing result between-10 ℃ and 100 ℃ 。

关 键 词：温度传感器 不匹配误差 动态范围 CMOS工艺 

分 类 号：TP212.1[自动化与计算机技术—检测技术与自动化装置]