VA140的单粒子闩锁试验研究  

Study on VA140 Single-event Latch-up Experiment

作　　者：张云龙[1,2] 崔兴柱[2] 龚依民[1] 彭文溪[2] 王焕玉[2] 张飞[2] 樊瑞睿[2] 梁晓华[2] 高旻[2] 龚珂[2] 王钇心 杨彦佶[1] 祝贵阳 刘彦良[1] 祝晓龙[1] 

机构地区：[1]吉林大学物理学院,长春130012 [2]中国科学院高能物理研究所,北京100049

出　　处：《核电子学与探测技术》2014年第12期1518-1519,1523,共3页Nuclear Electronics & Detection Technology

摘　　要：专用集成电路是为特定用户或特定电子系统制作的集成电路,具有高性能、高可靠性等优点。专用集成电路VA140是中国暗物质卫星有效载荷硅微条探测器的关键器件。为测试VA140的抗单粒子闩锁特性,设计了简单的测试系统。应用兰州近代物理研究所重离子加速器进行测试,得到了有效试验数据。对试验数据进行处理,得到了VA140的闩锁截面与线性能量传输值的关系曲线、VA140的闩锁阈值及饱和截面,为其航天应用提供必要试验依据。Application specific integrated circuit（ ASIC） is the integrated circuit that made for specific users or electric systems with advantages of high performance and high reliability etc. ASIC VA140 is a key component of the silicon microstrip detector payload being assembled on Chinese Dark Matter satellite. A test system is designed to test the single-event latch-up（ SEL） of VA140. The experiment was carried out at heavy ion accelerator lab in Lanzhou Institute of modern physics. A curve of latch profile VS LET was derived by the test data. The SEL threshold and the saturated section of VA140 were also derived by fitting with the formula of Weibull. The result is very important for this ASIC to be used in space application.

关 键 词：单粒子闩锁(SEL) 专用集成电路(ASIC) 线性能量传输(LET) 重离子 

分 类 号：V433[航空宇航科学与技术—航空宇航推进理论与工程]