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机构地区:[1]中国洛阳电子装备试验中心,河南洛阳471003
出 处:《半导体光电》2015年第2期213-215,共3页Semiconductor Optoelectronics
摘 要:在激光干扰的仿真试验中,要进行干扰效果评估,最直观的方法就是仿真出干扰图像。干扰图像的仿真是进行激光干扰内场仿真试验亟待解决的问题。文章研究了采用CTIA输入级电路以及CDS相关双采样预处理电路的HgCdTe探测器的干扰图像仿真。首先研究了激光干扰线阵探测器的干扰图像仿真,然后通过进一步分析串扰现象产生的原理,研究了激光功率密度分布不均匀时激光干扰面阵探测器的干扰图像仿真。分析了带背景的干扰图像仿真。In the simulation test of laser jamming, the most intuitive method is to simulate the jamming image for the evaluation of jamming effect. The image simulation is a problem that needs to be solved urgently for indoor laser jamming simulation test. In this paper, for the first time, the jamming image was simulated on laser jamming of HgCdTe detector with CTIA input and CDS correlated sample circuit. Firstly, the image was simulated of laser jamming on line array detector. Furthermore, the principles of cross-talk were analyzed and the image of jamming of laser with nonuniform power density on plane detector was simulated. And the image simulation of laser jamming with background on plane detector was analyzed.
分 类 号:TN977[电子电信—信号与信息处理]
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