Bi_4Ti_3O_(12)铁电薄膜飞秒三阶非线性光学性能研究  

The Femtosecond Third-Order Optical Nonlinearity of Bi_4Ti_3O_(12) Ferroelectric Thin Films

作　　者：李山[1,2,3] 钟向丽[1,2,3] 刘欣[4] 程光华[4] 王金斌[1,2,3] 黄健[1,2,3] 宋宏甲 李波[1,2,3] 

机构地区：[1]湘潭大学材料科学与工程学院,湘潭411105 [2]湘潭大学材料设计及制备技术湖南省重点实验室,湘潭411105 [3]湘潭大学装备用关键薄膜材料及应用湖南省国防科技重点实验室,湘潭411105 [4]中国科学院西安光学精密机械研究所,西安710119

出　　处：《现代应用物理》2015年第2期125-130,共6页Modern Applied Physics

基　　金：国家自然科学基金资助项目(11372266)

摘　　要：采用sol-gel方法在石英玻璃衬底上制备出α轴取向的多晶Bi_4Ti_3O_(12)(BIT)薄膜,根据透射谱曲线得到薄膜样品的线性折射率为2.35,线性吸收系数为9.81×10~3cm^(-1),光学带隙宽度为3.60 eV。以脉宽300 fs,波长800 nm的钛蓝宝石脉冲激光为光源,利用单光束Z-scan技术测得薄膜样品的双光子吸收系数为100.31GW·cm^(-2),三阶非线性折射率为-1.02×10^(-2)GW·cm^(-2)。实验结果表明,所制备的BIT铁电薄膜具有大的非线性光学系数,适合应用于光子器件的制备。The polycrystalline Bi4Ti3O12 （BIT） thin films with a-orientation were fabricated on the quartz substrates by a sol-gel technique. The fundamental optical constants （the bandgap, liner refractive index, and absorption coefficient） were determined as a function of light wavelength by optical transmittance measurements. By single-beam Z-scan experiments with femtosecond laser pulses at a wavelength of 800 nm, the third-order nonlinear refraction index and two-photon absorption coefficient were measured to be -1.02× 10^-2 GW· cm^-2 and 100.31 GW· cm^-2, respectively. The results indicate that the BIT candidate for applications in nonlinear photonic devices. film is a promising

关 键 词：BI4TI3O12 铁电薄膜 Z-SCAN 三阶非线性光学 

分 类 号：O484.41[理学—固体物理]