基于显微CT技术的C/C-SiC复合材料孔隙率测量方法  

Porosity Measurement Method of C / C-Si C Composites Based on Micro-CT Technology

作　　者：江柏红[1] 周金帅[1] 高晓进[1] 江玉朗 

机构地区：[1]航天特种材料及工艺技术研究所,北京100074

出　　处：《宇航材料工艺》2015年第4期122-126,共5页Aerospace Materials & Technology

摘　　要：提出了一种基于显微CT技术的测量复合材料孔隙率的新方法,研究了C/C-Si C复合材料体积孔隙率测量原理,讨论了测量区域体积对测量结果的影响。研究结果表明,显微CT技术能够获取复合材料内部三维微观图像,通过灰度直方图阈值分割法能够较为精确测量C/C-Si C复合材料体积孔隙率,并且只有选择的测量体积范围超过一定值时才能获得较为精确的测量结果。A novel method for measuring the volume porosity of the C / C-Si C composites based on micro-CT technology was proposed. We first disscussed the principle of this new method,and then investigated the influence of the measurement volume on its accuracy. The results showed that,using micro-CT technology,the 3D microstructures of the C / C-Si C samples in gray histogram mode were obtained. According to which,the volume porosity of the C / CSi C samples can be determined through threshold segmentation analysis. And it was of importance to find that a critical measurement volume is needed to obtain the volume porosity with a high accuracy.

关 键 词：显微CT 孔隙率 灰度直方图 阈值分割 

分 类 号：TG115.28[金属学及工艺—物理冶金]