基于改进测试策略的数字电路板测试系统  

Improved Testing Strategy for Digital Circuit Board Test System

作　　者：陈灿[1] 王建业[1] 王孔华[1] 王勇[1] 

机构地区：[1]空军工程大学防空反导学院,陕西西安710051

出　　处：《探测与控制学报》2015年第5期98-101,共4页Journal of Detection & Control

摘　　要：针对传统的数字电路板测试系统存在体积大、性价比不高和通用性不强等问题,提出了基于改进测试策略的数字电路板测试系统。该测试系统是在传统测试系统的基础上融合边界扫描技术改进了测试策略,既保证了功能测试又增强了系统的结构性测试。测试结果表明,改进的测试系统具有体积小、性价比高、通用性强和故障覆盖率高等优点,对测试系统的发展有着重要的理论意义和实用价值。Aimed at the problems of large size,low proportion,and poor generality of traditional digital circuit board test system,a digital circuit board test system based on improvement of testing strategy was put forward in this paper.The digital circuit board test system improved the testing strategy with boundary-scan architecture at the basic of the previous test equipment,which could ensure functional test and structural test.The test re-sults showed that the test system had many advantages such as small size,high proportion,strong generality and high fault coverage.

关 键 词：测试系统 测试策略 边界扫描 故障覆盖率 

分 类 号：TP206.3[自动化与计算机技术—检测技术与自动化装置]