FTIR测量的宽波数范围发射光谱强度校正  

Correction of intensity of emission spectra in a wide wave number range measured by FTIR

作　　者：张永刚[1] 奚苏萍 周立[1] 顾溢[1] 陈星佑[1] 马英杰[1] 杜奔[1] 

机构地区：[1]中国科学院上海微系统与信息技术研究所信息功能材料国家重点实验室,上海200050

出　　处：《红外与毫米波学报》2016年第1期63-67,共5页Journal of Infrared and Millimeter Waves

基　　金：973计划(2012CB619200;2014CB643900);国家自然科学基金(61275113;61204133;61405232;61334004)~~

摘　　要：针对采用FTIR方法在宽波数范围内测得不同样品的发射光谱在强度上难以做定量比较的困难,提出了一种简便可行的校正方案,即通过计算发射谱仪器函数来进行强度校正;对其可行性、限制因素及注意事项进行了详细讨论.以一组覆盖宽波数范围的样品为例用此方案测量校正了室温下测得的光荧光谱,并对校正前后的结果进行了比对分析,获得了与实际符合的结论.结果表明采用FTIR测量方法并结合适当的校正方案可以获得宽波数范围内的有效发光强度信息.To compare the actual luminescence intensity of different samples acquired in a wide wave number range using FTIR emission spectroscopy,a feasible and convenient correction scheme of calculated emission spectroscopy instrument function was proposed. The feasibility,limitations and matters need attention were discussed in detail. Based on those schemes,the luminescence intensities of a group of photoluminescence samples cover a wide wave number range have been corrected and compared with original data. Consistent results were gained. The validity of the schemes was confirmed.

关 键 词：发射光谱 校正 发光强度 光荧光 傅里叶变换 

分 类 号：TN2[电子电信—物理电子学]