辐射敏感器件辐射设计裕量指标的计算  

An Algorithm of Radiation Design Margins Index for Radiation Sensitive Devices

作　　者：刘燕芳 

机构地区：[1]中核控制系统工程有限公司,北京100176

出　　处：《核电子学与探测技术》2015年第10期1048-1050,1056,共4页Nuclear Electronics & Detection Technology

摘　　要：为了降低辐射对操作设备所产生的危害,在寿命周期内满足规定的连续性和可用性等可靠性指标要求。综合考虑设备所处位置的辐射特性,建立了总剂量效应敏感器件和位移损伤效应敏感器件RDM的一种计算方法。建设性地提出了辐射敏感器件施加不同RDM值所对应的风险等级,为在辐射环境下操作设备的设计工作寿命提供了保证。In order to reduce the harmful effects of the operation equipment which works in the radiation environment, meet the requirements of continuity and availability within the life cycle, considering the position environmental characteristics of the operation equipment, an algorithm of radiation design margins for total dose effect sensitive devices and displacement damage effect sensitive devices was given, which can control the radiation damage risk. Four risk levels basic on different radiation design margin of the radiation - sensitive devices were described, which can provide a guarantee for the design life of the equipment used in the radiation environment.

关 键 词：辐射敏感器件 辐射设计裕量 风险控制 总剂量效应 位移损伤效应 风险等级 

分 类 号：N945.17[自然科学总论—系统科学]