结构MRI对青少年癫脑皮质厚度的研究进展  

An overview on the research of cortical thickness of juvenile epilepsy based on structural magnetic resonance imaging

作　　者：宾果 汪天富[1] 秦璟[1] 周煜翔[1] 但果[1] 黄炳升[1] 

机构地区：[1]深圳大学医学部生物医学工程学院医学超声关键技术国家地方联合工程实验室广东省医学信息检测与超声成像重点实验室,深圳518060

出　　处：《国际医学放射学杂志》2016年第2期123-126,共4页International Journal of Medical Radiology

摘　　要：青少年癫日发病率高,发作形式多样,对病人大脑皮质、认知能力的发育有较大影响。研究青少年癫日大脑皮质厚度的变化对该病的早期诊断和治疗至关重要。大脑皮质厚度是癫日诊断和治疗的重要生物特征指标,可为癫日脑组织形态和病理特征研究提供依据。就结构MRI对青少年癫日病人的大脑皮质厚度变化的检测及大脑皮质厚度与病程、临床症状和抗癫日药的关系等方面的研究进展予以综述。Juvenile epilepsy is a syndrome with high prevalence and various seizure forms, and has great impact on the development of brain cortex as well as cognitive competence. In order to improve the diagnosis and treatment at early stage, it is essential to study the change of cortical thickness in these patients. Cortical thickness can carry useful information of brain morphologic and pathological characteristics, and is a potentially important biomarker in the diagnosis and treatment of epilepsy. This review covers the findings about the relationship between cortical thickness abnormalities and seizure duration, clinical symptoms and antiepileptic drugs of patients with juvenile epilepsy.

关 键 词：癫日 青少年 磁共振成像 脑皮质厚度 

分 类 号：R322.81[医药卫生—人体解剖和组织胚胎学]