基于位流回读的VirtexⅡ内嵌BRAM的测试方法研究  

Research on Bitstream Readback-based Test Method for Mbedded BRAM in VirtexⅡ

作　　者：阎哲[1] 张洪[1] 介百瑞 阮爱武[1] 

机构地区：[1]电子科技大学电子薄膜与集成器件国家重点实验室,四川成都610054

出　　处：《微电子学与计算机》2016年第5期58-61,共4页Microelectronics & Computer

摘　　要：介绍一种采用位流回读针对VirtexⅡ内嵌BRAM的测试方法.该测试方法基于自主研发的FPGA测试平台,该测试系统能够对FPGA配置、施加测试向量、回收测试响应、并对故障进行诊断与定位,整个测试完全自动化,不需要人工干预.该测试系统的优点为设备简单、易于实现、完全自动化.在该测试系统的基础上,针对Virtex II系列FPGA内嵌核Block RAM提出了基于边界扫描和位流回读的测试方法.该方法首次将位流回读技术应用于FPGA的测试,基于位流回读的测试方法为FPGA的测试打开一个新的领域,对研究FPGA的测试方法有重要意义.This paper mainly presents a bitstream readback-based test method for embedded BRAM in Virtex Ⅱ , which based on the independent research of FPGA test platform. The test system can configure the FPGA, apply test vectors, receive the response and diagnosis and locate the faults. The entire system is fully automated, no need of human intervention. The advantage of this system is easy to implement and has not much requirements in hardware. Based on the test system, this paper proposes a method of boundary scan and readback for the embedded BRAM in Virtex Ⅱ. This method firstly uses the readback method into the FPGA testing, which open a new filed in FPGA testing, therefore it has great significance.

关 键 词：边界扫描 位流回读 存储器 测试系统 

分 类 号：TN791[电子电信—电路与系统]