基于图像技术的小麦籽粒三维信息测量  

Three-dimensional information measurement of wheat grain based on image technology

作　　者：仲晓春[1] 陈雯 刘涛 郝心宁 李哲敏[1] 孙成明 

机构地区：[1]中国农业科学院农业信息研究所,北京100081 [2]扬州大学江苏省作物遗传生理重点实验室/小麦研究所,江苏扬州225009

出　　处：《广东农业科学》2016年第2期150-155,共6页Guangdong Agricultural Sciences

基　　金：中国农业科学院科技创新工程项目

摘　　要：为了实现小麦籽粒三维信息的快速测定,设计了一种利用图像分析技术测量小麦籽粒长、宽、厚信息的方法。利用麦粒最稳定极值区域(MSER)的长和宽,借助一定角度的光源使麦粒产生影子,根据不同厚度麦粒产生影子的宽度不同来测定籽粒的厚度,从而获得麦粒的三维信息。通过对4个不同小麦品种共256颗麦粒进行图像处理测量和游标卡尺测量实验,在比较两种方法的试验结果发现,两者测量麦粒长、宽、厚的相关性均较高,R2值均高于0.9,RMSE分别为0.0988、0.08413、0.0917。结果表明借助光源通过单幅二维图像可快速准确测量小麦籽粒三维信息,可为小麦籽粒三维信息智能化测量提供参考。In order to get the three-dimensional information of wheat grains rapidly, a method based on image analysis technology was designed to calculate the length, width and thickness of wheat grains. Minimal outer rectangle of grain was used to calculate the grain＇s length and width. The striplight at specific angles was used to generate shadows of wheat grains, and those shadows could describe the thickness of grains one-to-one. We medsured the 256 grains of 4 varieties with image analysis technology and vernier caliper. Then we compared the results and got a high correlation coefficient （ R：〉0.9 ） , respectively. The root mean square error of the length was 0.0988, and the width and thickness were 0.09413 and 0.0917. All the results demonstrated that the three-dimensional information of wheat grains could be obtained by a two-dimensional picture depending on the light source, and the method discussed in this paper is promising and encouraging to obtain the three-dimensional information of wheat grains.

关 键 词：小麦 籽粒三维 影子 图像处理 最稳定极值区域 

分 类 号：S512[农业科学—作物学] TP391.41[自动化与计算机技术—计算机应用技术]