边界扫描测试技术综述  

Boundary scan test technology were reviewed

作　　者：张继伟[1] 杨兵[1] 

机构地区：[1]北方工业大学微电子学系

出　　处：《电子世界》2016年第10期34-36,共3页Electronics World

摘　　要：随着集成电路的快速发展,使得测试面临的问题也越来越多,在众多的测试技术中边界扫描测试越来越多的受到人们的关注。本文总结性的从边界扫描技术的研究现状,现如今已经取得的部分研究成果,以及边界扫描技术所面临的问题三方面进行介绍并总结,并对边界扫描技术的发展做出展望,提出一种延时故障测试的方法。With the rapid development of integrated circuit, make the test problems we are facing more and more, boundary scan test in numerous testing technology, more and more get the attention of people.This article summary from the research status of boundary scan technology, now has been part of the research results, and the boundary scan technology to introduce and summarize the problems facing three aspects, and make prospect for the development of boundary scan technology.

关 键 词：集成电路 边界扫描 展望 

分 类 号：TN407[电子电信—微电子学与固体电子学]