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作 者:黄成威 陈沛君[1] 秦彤非 张大伟[1] 张永顺[1] 蒋锋[1]
出 处:《湖北农业科学》2016年第6期1375-1378,共4页Hubei Agricultural Sciences
基 金:广东省科技计划项目(2012B020301006)
摘 要:采用长保鲜期甜玉米自交系T_3和短保鲜期自交系T_(15)为亲本,配制T3×T15组合的6个世代(P_1、P_2、F_1、B_1、B_2和F_2),用"主基因+多基因混合遗传模型"结合六世代联合遗传分析的方法对甜玉米保鲜相关性状进行遗传分析,研究甜玉米保鲜相关指标的遗传规律及其分子基础。结果表明,甜玉米自交系T3的采后含糖量下降速率受2对加性-显性-上位性主基因+加性-显性多基因控制;各分离世代以主基因遗传为主,回交世代B_1的主基因遗传率为74.63%,多基因遗传率为17.67%;B_2的主基因遗传率为91.98%,多基因遗传率为0;F_2的主基因遗传率为82.67%,多基因遗传率为12.93%。In order to study the genetic regularity and its molecular basis of the related indicators of sweet corn fresh keeping , this study adopts sweet corn inbred lines T3 with long freshness date and inbred lines Tls with short freshness date as parents to prepare six generations (PI,P2,F1,Bx,B2 and F2) of T3 x Tl5 combination. The genetic analysis of the sweet corn fresh keeping related indicators were achieved by combining "major gene + polygene mixed inheritance model" with joint genetic analysis of six generations. The results showed that the decline rate of the postharvest sugar content in sweet corn inbred lines T3 was dominated by two additive-dominance-epistatic major genes+additive-dominant polygenes; each separate generation was influenced by its major genes, for backcross B1, the heritability of major genes and polygene was 74.63% and 17.67%, respectively; for B2, the heritability of major gene and polygene was 91.98% and 0.00%, respectively; for F2, the heritability of major gene and polygene was 82.67%, and 12.93%, respectively.
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