溯源至低温辐射计的硅陷阱探测器紫外波段绝对光谱响应度测量（英文）  

Ultraviolet Spectral Responsivity of Silicon Trap Detectors Traceable to a Cryogenic Radiometer

作　　者：刘长明[1,2] 史学舜[1,3,2] 陈海东[1,2] 刘玉龙[1,2] 赵坤[1,2] 应承平[1,2] 陈坤峰[1,2] 李立功[1,3,2] 

机构地区：[1]国防科技工业光电子一级计量站,山东青岛266555 [2]中国电子科技集团公司第四十一研究所,山东青岛266555 [3]电子测试技术重点实验室,山东青岛266555

出　　处：《光子学报》2016年第9期93-97,共5页Acta Photonica Sinica

基　　金：The National Basic Research Program of China(Nos.J312013A001,JSJC2013210B021);the National High Technology Research and Development Program of China(No.2015AA123702)

摘　　要：介绍了溯源至低温辐射计的紫外绝对光谱响应度测量装置,对硅陷阱探测器在三个激光波长点进行了绝对光谱响应度校准实验.测量了硅陷阱探测器的空间均匀性和非线性系数,分析了影响测量准确度的各不确定度分量.实验表明:硅陷阱探测器在紫外波段266、325、379nm三个激光波长点处的绝对光谱响应度测量扩展不确定度分别为0.19%、0.14%、0.11%,可作为紫外波段光辐射功率基准保持和传递的标准探测器,用于提高紫外波段光谱辐射度的校准能力.An experimental facility designed for the calibration of silicon trap detectors against a laser- based cryogenic radiometer at three laser wavelengths in the Ultraviolet （UV） region was described. The experimental results for the spatial nonuniformity and nonlinearity of the silicon trap detector were shown and discussed. The component uncertainties associated with the measurement of radiation power and spectral responsivity of silicon trap detectors were analyzed. As the secondary detector standards, the expanded uncertainty of the spectral responsivity at three UV laser lines 266, 325, 379 nm is 0.19 %, 0.14 %,0.11%, respectivily. This can improve the calibration capability of UV band spectral radiance.

关 键 词：紫外波段 硅陷阱探测器 绝对响应度 低温辐射计 空间均匀性 非线性 

分 类 号：TN23[电子电信—物理电子学]