基于IEEE1149.1至IEEE1149.7转换器的研究与实现  

Research on the Converter from IEEE1149.1 to IEEE1149.7

作　　者：颜学龙[1,2] 王洋冰 陈寿宏[1,2] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004 [2]广西自动检测技术与仪器重点实验室,广西桂林541004

出　　处：《微电子学与计算机》2016年第11期133-136,141,共5页Microelectronics & Computer

基　　金：广西自动检测技术与仪器重点实验室基金项目(YQ15101)

摘　　要：IEEE1149.7标准相对于IEEE1149.1标准新增了很多测试与调试的功能,解决了现今复杂度高的芯片和系统无法测试的问题.在深入地研究IEEE1149.1和IEEE1149.7两种标准的基础上,利用自上而下的设计方法完成了由IEEE1149.1信号变为IEEE1149.7信号转换器的设计,在QuartusⅡ平台中通过Verilog语言实现,将设计应用在FPGA中,并用QuartusⅡ中嵌入式逻辑分析仪SignalTapⅡ采集FPGA的输出信号.输出结果表明所设计的方案可以将IEEE1149.1信号转化为IEEE1149.7信号,可用于IEEE1149.7的待测系统进行测试与调试.IEEE1149. 7 standard with respect to the IEEE1149. 1 standard added a lot of testing and debugging features, to solve the problem of high complexity of today＇s chips and systems can＇t be tested. In-depth research foundation IEEEl149. 1 and IEEEl149. 7 two standards on the use of top-down design method to complete the conversion by the IEEEl149. 1 IEEEl149.7 converter design in Quartus Ⅱ platform by Verilog language the design in FPGA, and SignalTap Ⅱ embedded logic analyzer capture FPGA output signal in Quartus Ⅱ. The output results show that the design of the program can transform IEEEl149. 1 signal into IEEEl149. 7 signal that can be used IEEEl149. 7 test system for testing and debugging.

关 键 词：IEEE1149.7 转移器 测试与调试 

分 类 号：TN4[电子电信—微电子学与固体电子学]