Gray码结合线移的结构光三维测量  

3D Measurement Based on Structured Light Using a Combination of Gray Code and Line-shift Patterns

作　　者：石爱军 白瑞林 田青华 

机构地区：[1]江南大学轻工过程先进控制教育部重点实验室,江苏无锡214122

出　　处：《光电工程》2016年第11期26-32,共7页Opto-Electronic Engineering

基　　金：江苏高校优势学科建设工程资助项目(PAPD);江苏省产学研前瞻性联合研究项目(BY2015019-38)

摘　　要：针对二值条纹的边缘扩散问题,本文提出了一种改进型线移的结构光三维测量方法。该方法根据图像像素的邻域关系和逻辑关系,采用优化预处理方法得到了条纹图像的单像素边缘;根据边缘扩散对边缘定位的影响,采用一种二值图案对称线移的方法,线移条纹以Gray码最后一幅图案的条纹中心为基准向两侧对称线移,线移条纹宽度与Gray码最小周期宽度相等、方向与Gray码条纹方向平行;采用正交投射实现了对测量视野的唯一性编码。实验结果表明,该方法对平面重构的相对误差为0.07%,耗时5.41 s,满足精度和实时性的要求。将该方法应用在混合物体的表面测量实验中,结果验证该方法对不同工件具有良好的适应性。In order to solve the problem of edge diffusion existing in binary patterns, an improved 3D measurement method based on structured light was proposed. Edges with pixel accuracy were obtained by adopting an optimized preprocessing approach according to pixel neighborhood relation and logic relation of images. Considering the influence of edge diffusion for edge detection, a line-shift strategy was applied which translated line-shift patterns symmetrically based on the centerline of the last Gray code pattern＇s stripes. At same time, the width of line-shift stripes was equal to the minimum of Gray code stripes width and its direction was same as Gray code patterns＇. Finally, codes of the whole-field were calculated by projecting vertical and horizontal patterns respectively. Experiments show that the relative error of reconstructing a plane is 0.07% and the reconstruction time is 5.41 s, which meets the accuracy and real-time demands. Applying this method in measuring surface of mixed targets, results prove that the proposed strategy has good adaptability of different parts.

关 键 词：三维测量 结构光 GRAY码 线移 

分 类 号：TP24[自动化与计算机技术—检测技术与自动化装置] TP24[自动化与计算机技术—控制科学与工程]