外推法天线增益测量系统的暗室反射影响评估  

A method to evaluate the chamber reflection effect for antenna gain measurements using an extrapolation range

作　　者：刘潇[1] David Gentle 

机构地区：[1]中国计量科学研究院(NIM),北京100029 [2]National Physical Laboratory(NPL)

出　　处：《电波科学学报》2016年第5期1004-1008,共5页Chinese Journal of Radio Science

基　　金：科技部国际科技合作与交流专项(2013DFA70570);国家科技支撑计划项目子课题(2014BAK02B01)

摘　　要：介绍了外推法技术,在此基础上提出一种基于几何光学的吸波材料影响评估方法.该方法可以在数字滤波后有效模拟并引入反射信号,通过比较两次外推后的数据,得到对增益测量的影响评估结果.在中国计量科学研究院(National Institute of Metrology,NIM)的外推法装置中进行实验验证,结果表明:该方法可以有效模拟吸波材料的影响,并给出由吸波材料引入的增益测量不确定度分量.该方法目前已应用到NIM和英国国家物理研究院(National Physical Laboratory,NPL)的外推法测量结果评定中,不仅对于外推法,对于在暗室中进行的其他天线测量结果的评估也具有很好的参考价值.The extrapolation technique is introduced,and an absorber effect evaluation method is pro-posed based on the geometrical optics.The method can effectively simulate the reflected wave from the ab-sorber,and by using the extrapolation technique twice,the effect on antenna gain results can be evaluated. The method has been verified in the new extraploation range of ,and NIM （National Institute of Metrolo-gy,China）the results agree well with the prediction.The uncertainty due to the absorber effect can there-fore be evaluated and the proposed method has already been applied in the extrapolation ranges at NIM and NPL（National Physical Laboratory,UK）.The application of the method is not limited to extrapolation ranges,and it can be easily extended to be applied in other antenna measurement systems located in the chamber.

关 键 词：外推法 天线增益 吸波材料反射率 不确定度评定 

分 类 号：TN015[电子电信—物理电子学]