常用逻辑门芯片测试装置研究与设计  

Research and design of testing device for common logic gate chip

作　　者：刘艳[1] 唐海贤 景昊[1] 张斌[1] 高茜[1] 

机构地区：[1]河海大学物联网工程学院,江苏常州213022

出　　处：《实验技术与管理》2017年第1期94-97,103,共5页Experimental Technology and Management

基　　金：江苏高校品牌专业建设工程一期项目(PPZY2015B141);河海大学高等教育科学研究2015年度立项课题"翻转课堂模式下的电类课程实践教学模式研究与实践"(20151212)

摘　　要：结合数字电路相关课程的改革,针对数字电路中常用的74/54系列逻辑门芯片,研究并设计了一种基于单片机最小系统的常用逻辑门芯片测试装置。该装置为电子技术相关理论和实践教学提供了快速、直观、稳定的测试方式,提高了实验室芯片检测的效率与准确率,同时也提高了理论与实验课程的教学效果。Combined with Jiangsu University brand-specialty construction engineering project,the reform in the Digital Circuit course is carried out.Aiming at the 74/54 series logic gate chip commonly used in the digital circuit,the testing device for a common logic gate chip based on the minimum system of the single-chip microcomputer is researched and designed.The device provides that this fast,direct and stable testing method for the related theory and practical teaching of electronic technology can improve the efficiency and accuracy of the laboratory chip testing,and at the same time enhances the teaching effect of the theory and experimental courses.

关 键 词：数字电路 逻辑门 芯片测试 实践教学 

分 类 号：TP211.5[自动化与计算机技术—检测技术与自动化装置] G642.0[自动化与计算机技术—控制科学与工程]