检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:Mohammed K. KHALAF H. F. Al-TAAY Dawood S. ALI
机构地区:[1]Ministry of Science and Technology, Center of Applied Physics, Baghdad, Iraq [2]Department of Physics, College of Science for Women, University of Baghdad, Baghdad, Iraq [3]Department of Physics, College of Education for Pure Sciences, University of Anbar, Anbar, Iraq
出 处:《Photonic Sensors》2017年第2期163-170,共8页光子传感器(英文版)
摘 要:In this research, the effects of target sputtering power on the structure and optical properties of radio frequency (RF) sputtered Ti6A14V films were investigated. Different sputtering RF powers were used to produce different thicknesses of Ti6A14V thin films, From the X-ray diffraction, it was found that the Ti6A14V films had polycrystalline cubic and hexagonal structures and increased films crystallinity and crystalline size with increasing the sputtering power. Atomic forces microscopy (AFM) gave us a nanometric film character, films homogeneity, and surfaces roughness. A higher degree of roughness and average grain size with increasing RF power was exhibited. Band gap and refractive index of Ti6A14V thin films varied with sputtering RF powers.In this research, the effects of target sputtering power on the structure and optical properties of radio frequency (RF) sputtered Ti6A14V films were investigated. Different sputtering RF powers were used to produce different thicknesses of Ti6A14V thin films, From the X-ray diffraction, it was found that the Ti6A14V films had polycrystalline cubic and hexagonal structures and increased films crystallinity and crystalline size with increasing the sputtering power. Atomic forces microscopy (AFM) gave us a nanometric film character, films homogeneity, and surfaces roughness. A higher degree of roughness and average grain size with increasing RF power was exhibited. Band gap and refractive index of Ti6A14V thin films varied with sputtering RF powers.
关 键 词:RF magnetron sputtering TI6A14V structural properties optical properties.
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.43