基于失败向量信息的难测固定故障测试向量生成  

Test Vector Generation Method of Hard to Detect Stuck-at Faults Based on Failed Vectors Information

作　　者：黄斌科[1] 邓亮[1] 赵秀才[2] 侯明星[1] 

机构地区：[1]西安交通大学电子与信息工程学院,陕西西安710049 [2]中国电子科技集团公司第四十一研究所,山东青岛266555

出　　处：《微电子学与计算机》2017年第4期140-145,共6页Microelectronics & Computer

摘　　要：针对数字电路中难测固定故障测试向量生成效率低的问题,基于失败向量信息实现难测固定故障的测试向量生成.该方法利用难测固定故障失败向量与成功向量在端口逻辑值上可能具有的相反属性,以输入端口逻辑值的概率信息量化失败向量的特征,从而提高难测固定故障成功测试向量生成的生成概率,缩小测试向量的搜索范围,提高了测试向量生成的效率.A test vector generation algorithm based on failed vectors information is proposed to solve the low generation efficiency problem for finding hard to detect stuck-at faults in digital circuits.Utilizing the noncorrelation properties between the failed and successful test vectors in each port of the primary input,the method increases the generation probability of successful test vectors gradually for hard to detect struck-at fault through the probability information of logical values at primary input of previous failed vectors.By moving away from the test vectors similar in properties to these failed test vectors,the test vector space is vastly reduced.

关 键 词：难测固定故障 测试向量生成 失败向量 生成概率 

分 类 号：TN707[电子电信—电路与系统]