基于ATE的集成电路交流参数测试方法  

Test Method of AC Parameters for ATE-based ICs

作　　者：孙莉莉 李楠 

机构地区：[1]无锡中微爱芯电子有限公司,江苏无锡214072

出　　处：《电子与封装》2017年第3期10-12,18,共4页Electronics & Packaging

摘　　要：当前集成电路设计和制造方面的发展速度很快,集成电路规模和水平不断提高,也促进了相应的测试技术的发展。集成电路交流参数的准确性已经成为影响集成电路性能的重要因素。介绍了交流参数测试的基本概念和原理,简述了基于TR6836测试系统对交流参数测试的具体方法、流程以及测试程序开发等内容,并以74HC04为例进行了测试,对交流参数的两种测试方法——搜索法和功能验证法进行了对比和分析。Against the background of the fast development of IC design and manufacturing, the continuously improvement of the IC＇s scale and level has promoted the development of test technology. The accuracy of AC parameters has become an important factor affecting the performance of ICs. The paper oversees the basic concepts and principles of AC parametric testing, and discusses the method of AC parametric test. The specific method, flow and test program of AC parameter test based on TR6836 test system is presented. Using the system, the 74HC04 is taken as an example to compare and analyze the two test methods of AC parameters： search method and function verification method.

关 键 词：集成电路 交流参数 自动测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]