基于C8051的片上调试单元设计  

Design of On-chip Debug Unit Based on C8051

作　　者：俞小平 唐映强 李世伟 

机构地区：[1]无锡中微爱芯电子有限公司,江苏无锡214072

出　　处：《电子与封装》2017年第3期19-21,25,共4页Electronics & Packaging

摘　　要：随着半导体工艺与集成电路技术的快速发展,微处理器的集成度越来越高,在设计中开发比较大的应用程序时,强劲的调试手段是非常重要的。当bug复杂到无法分析时,只能用调试来追踪它,集成片上调试功能更显得尤为重要。基于C8051 IP设计了一个片上调试单元,将调试功能集成到单片机内部。通过配置不同的操作指令,该片上调试单元可实现断点指令、地址断点、停止及单步执行程序、数据观察点、运行到光标处等调试功能。With the rapid development of semiconductor and integrated circuit technology, the integration level of microprocessor is becoming higher and higher. A strong debugging tool is very important during the development of large applications, especially when the bugs are too complicated to analyze. Based on the C8051 IP, the article presents an on-chip debug unit and integrates the debugging function into the MCU. With different configuration instructions, the on-chip debug unit can realize breakpoint instruction, address breakpoint, stop or single step execution procedures, data observation point, run to the cursor and other debugging functions.

关 键 词：集成电路 片上调试 C8051 

分 类 号：TN402[电子电信—微电子学与固体电子学]