负氢离子引出PIC-MCC数值模拟算法  

The 3D PIC-MCC Numerical Simulation Studies on the Extraction of Negative Hydrogen Ions

作　　者：廖鹏[1] 王树青[1] 彭丽[1] 杨超[1] 印茂伟[1] 

机构地区：[1]西南科技大学国防学院,四川绵阳621010

出　　处：《西南科技大学学报》2017年第1期97-100,共4页Journal of Southwest University of Science and Technology

基　　金：自然科学基金重点基金(11035004);自然科学基金青年基金(51407169);中物院科学技术发展基金(2013A0402018);西南科技大学博士基金项目(13ZX7106);浙江省科技计划项目(2013C33073)

摘　　要：首先介绍了负氢离子产生机理,阐述了三维蒙特卡罗碰撞处理(MCC)方法,结合经典电磁与粒子互作用模拟(PIC)算法,成功研制了全三维PIC-MCC算法,并采用该算法对串联双腔多峰离子源中负氢离子(H^-)引出过程进行了数值模拟。模拟结果显示:表面产生H^-引出概率为27.8%,远大于体积产生H^-引出概率;体积产生H^-的产生位置距离引出电极越远,引出效率越低;随着离子源放电室气压的增大,体积和表面H^-引出效率都将减小。This paper describes the mechanism of negative hydrogen ions and elaborates three-dimensional Monte Carlo Collision handling（MCC） method. By combining classical electromagnetic interaction with the particle simulation（PIC） algorithm,a full three-dimensional PIC-MCC algorithm was successfully developed. With the algorithm,a numerical simulation was conducted to study the process that the negative hydrogen ion from the Series dual-chamber multimodal ion source is extracted. The simulation results show that the surface producing H^-ions leads to a probability of 27. 8%,which is much larger than the probability of the volume generation of H^-ions. What＇s more,the farther away from the producing Electrode the location of the volume generating H^-ions,the lower the efficiency is. With the pressure of the ion source discharge chamber increasing,both volume and surface generating H^-ions＇ extraction efficiency will be reduced

关 键 词：H^- 表面产生 体积产生 粒子模拟 蒙特卡罗碰撞 

分 类 号：O532.11[理学—等离子体物理]