非接触智能卡的研究和测试  

RFID Study and Measure

作　　者：钱鸣镝 

机构地区：[1]上海先进半导体制造股份有限公司,上海200233

出　　处：《集成电路应用》2017年第4期68-73,共6页Application of IC

摘　　要：智能卡投入商用前所进行的一系列测试项目显得尤为重要。针对智能卡的测试,有一系列的国际行业标准,针对其特点和应用范围,对卡片规格和性能做出了严格的规定[1-2]。作者除了对非接触性智能卡从应用技术、发展、工作原理做了比较全面的研究,还针对一款非接触性智能卡的RF特性测试、逻辑功能测试、记忆测试,以及特定情况下模拟测试制定了测试方案,并且已经实现,投入生产。It is very important for RFID to measure a set of more complete test item before it reach the hand of end user. There are a series of international trade standard for RFID test, in which set up serious prescribe for RFID spec and performance including its characters and application ranges. In this text, Besides it study RFID from application technology, development, and working principle, the test project for a type of RFID, which has been put into product, was made about RF character measurement, logical function measurement, memory measure, and simulation measurement under special condition.

关 键 词：非接触性智能卡 记忆测试 模拟测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]