基于频谱响应特性的集成电路故障预测技术  

Integrated Circuit Fault Prognostics Based on the Spectral Response Characteristics

作　　者：叶琳[1] 陆裕东[2] 王歆[1] 黄云[2] 何春华[2] 侯波[2] 

机构地区：[1]华南理工大学材料科学与工程学院,广州510640 [2]工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室,广州510610

出　　处：《半导体技术》2017年第6期475-480,共6页Semiconductor Technology

基　　金：民机预研专项资助项目(MIZ1528010);国家技术基础科研项目(JSZL2014610B002)

摘　　要：提出了一种基于频谱响应特性的集成电路故障预测技术,该技术成功实现了数字芯片SP3232E在故障诊断与故障预测中的应用,并验证了其在电子元器件的故障诊断与故障预测上的可行性与有效性。实验结果表明,该方法的故障诊断准确率高达92%以上;该数字器件延时信号经过频谱分析后的相位与其对应的退化率呈单指数函数关系,且随着扫频频率的减小,器件的相位增加,退化率减小,退化率50%~80%对应的相位区间可定义为器件的故障诊断阈值或预警区间;在低频下相位的变化速度更慢,故该方法在低频下的故障预测误差更小,故障预测精度更高。An integrated circuit fault prediction technique based on spectral response characteristics was proposed. This technology was successfully used in fault prognostics and fault diagnosis of the digital chips of SP3232E, and its feasibility and effectiveness in fault diagnosis and fault prediction of electronic components were verified. The experimental results show that the fault diagnosis accuracy rate of the method is up to 92%. The phase of the digital device delay signal after spectral analysis is related to its corresponding degradation rate as a single exponential function, and with the decreasing of the sweep fre- quency, the phases of the device is increased and the degradation rate is reduced. The phase range of the degradation rates from 50% to 80% can be defined the fault diagnosis threshold or warning interval of the device. At lower frequency, the gradient of the phase is more slowly, so the fault prognostics error of the method is smaller at low frequency, and the accuracy of fault prognostics is higher.

关 键 词：频谱响应 集成电路 故障诊断 故障预测 延时信号 

分 类 号：TN407[电子电信—微电子学与固体电子学]