耦合条件的MC/DC测试用例集生成算法  

Test Case Generation Algorithm Based on MC/DC with Coupling Conditions

作　　者：谢祥南[1] 魏延栋[1] 

机构地区：[1]中国航空无线电电子研究所,上海200241

出　　处：《计算机系统应用》2017年第6期164-169,共6页Computer Systems & Applications

摘　　要：MC/DC是一套航电A级软件的测试覆盖性准则,可以有效减少测试用例量.针对如何快速获取尽可能小的测试用例集这一难点展开研究,重点关注于具有耦合条件的逻辑表达式,提出了两套解决方案,分别用于解决零耦合/弱耦合条件和强耦合条件问题,并给出了示例证明.结果表明,灵活使用两套算法,可以全面解决一般逻辑表达式的MC/DC测试用例集的快速生成问题.MC/DC is a coverage criterion for the verification of avionics software of Level A, which can massively lower down the number of test cases. This paper focuses on the research of the logical expression with coupling conditions, and studies how to obtain the test case set as small as possible. It proposes two solutions which can be used respectively to solve the problems under the conditions of zero-coupling/weak-coupling and strong-coupling, and related examples are showed. The result shows that flexible usage of the two algorithms can solve the problems of rapid generation of MC/DC test case set for general logic expression.

关 键 词：MC/DC覆盖 测试用例 条件 判定 耦合 逻辑 

分 类 号：TP311.53[自动化与计算机技术—计算机软件与理论]