一种常用数字电路芯片功能检测系统  

A Testing System of Commonly Used Digital Crcuitchip

作　　者：刘艳[1] 高茜[1] 张斌[1] 景昊[1] 唐海贤 

机构地区：[1]河海大学物联网工程学院,江苏常州213022

出　　处：《实验室研究与探索》2017年第5期68-71,共4页Research and Exploration In Laboratory

基　　金：江苏高校品牌专业建设工程资助项目(PPAY2015B141);河海大学高等教育科学研究2015年度立项课题(20151212)

摘　　要：开发了一种芯片功能检测系统,该系统基于实践教学中的与非门、反相器、数据选择器、计数器、译码器、显示译码器等常用芯片进行设计,由上位机和硬件电路两部分组成。上位机用以实现对芯片功能表或真值表的输入、管理及发送;硬件电路负责接收功能表或真值表信号并完成芯片的检测,得出芯片是否损坏或功能是否正常的结果,并显示或报警。本系统可以降低数字电路实践中检测芯片的难度和复杂度,并提高准确度,为实验结果的正确性奠定了基础。There are some problems such as complex circuit connection, inefficiency detection in digital circuit practical teaching. Hence, the research group has studied and designed a testing system of commonly used digital circuit chip. The system is based on NAND gate, phase inverter, data selector, counter, decoder and display decoder of the practical teaching. It is composed of upper system and hardware circuit. The upper system serves as entering, management, transmitting function table or truth table. The hardware circuit serves as receiving the signals to testing chip, providing result whether the chip gets damaged or chip＇ s function is normal, and showing the testing result. The system can reduce difficulty and complexity and improve the accuracy of chip testing in the digital circuit practice teaching. That is essential to conduct a correct experiment.

关 键 词：数字电路 芯片检测 实践教学 

分 类 号：TN606[电子电信—电路与系统] G642.0[文化科学—高等教育学]