低成本片上射频内建自测系统的关键参数测量  

RF build-in self-test and key measurement processing for the low-cost system-on-chip

作　　者：朱嘉[1] 刘红侠[1] 

机构地区：[1]西安电子科技大学微电子学院,陕西西安710071

出　　处：《西安电子科技大学学报》2017年第4期29-33,共5页Journal of Xidian University

基　　金：国家自然科学基金资助项目(61376099;11235008)

摘　　要：针对芯片射频测试成本不断提高的问题,提出了一种低成本片上系统射频内建自测电路结构及其关键参数测量处理方法.此射频内建自测结构着重利用片上已有数字信号处理器、坐标旋转数字计算机和模数转换器对射频测试信号进行数字傅里叶变换,并利用低成本结构进行对数计算得到相应的信噪比.另外,该自测结构利用环回结构设计,将射频部分产生的信号用来作为测试信号而避免了外部噪声的干扰.这种射频内建自测方法已经成为一种有效的、低成本的设计方法,并用于新产品的量产.相对于以往的射频测试方法,该方法有效地减小了额外的硬件开销,在保证测试质量的情况下,降低了射频电路的测试成本.The major occupation in testing cost for the RF blocks of a system-on-chip （SOC） makes it a critical issue in the current complex integrated system. In this paper, a low cost RF Build-In Self-Test structure and methods for processing test data are proposed. The RF front-end has been tested with the help of on-chip DSP, CORDIC and ADC converters. The Digital Fourier Transform （DFT） and SNR results of the generated digital signature are presented in detail with the innovated logarithm calculation method. With the specified loopback structure design, the internal test tone can be used to avoid external noise influence. The RF BIST is applied and verified in mass production, which is effective for low-cost production. Compared to the traditional RF testing, this method can reduce the hardware overhead and decrease the cost with high testing quality.

关 键 词：射频内建自测 坐标旋转数字计算机 环回结构 信噪比 

分 类 号：TN4[电子电信—微电子学与固体电子学]