反射分量分离与像素填补结合的高光抑制方法  

Highlight Suppression Method by Combining Reflection Component Separation with Pixel Filling

作　　者：于晓洋[1] 潘宗玮[1] 孙晓明[1] 刘野[1] 

机构地区：[1]哈尔滨理工大学测控技术与仪器黑龙江省高校重点实验室,黑龙江哈尔滨150080

出　　处：《哈尔滨理工大学学报》2017年第3期73-79,共7页Journal of Harbin University of Science and Technology

基　　金：国家自然科学基金(61401126;F011702);黑龙江省自然科学基金(QC2015083);黑龙江省教育厅科学技术研究项目(12541171);黑龙江省博士后资助项目(LBH-Z14121)

摘　　要：针对陶瓷、金属等光滑表面在结构光三维测量时,由于表面局部的强反射特性使得物体失真产生较大测量误差这一问题。依据反射分量分离理论,设计了一种反射分量分离结合像素填补的改进算法。首先通过像素参数对比方法找到图像中的高光像素点,然后对其进行反射分量分离处理,为了避免一些高光强度过大的像素点在处理之后变为黑点,本文采用像素填补方法对其进行处理。实验结果表明,采用此种算法对1920×1080分辨率的图像进行处理,其高光像素的数目降低了8~11倍,实现了三维测量领域中强反射表面高光的有效去除。In structured light 3D measurement field,when the object is smooth surface,it can form a highlight area due to the specular reflection of the surface,and the distortion of the object will make a large measurement error. In order to solve this problem,a new algorithm is designed which is based on the theory of reflection component separation and pixel filling. Firstly,the specular pixels in the image are found by comparing the pixel parameters,Then the reflection component is separated and processed. Finally,in order to avoid some of the highlight are processed into black pixels the pixel filling method is adopted to deal with them. Experimental results show that when we deal with the image of 1920 ＊ 1080 by using this algorithm,the number of specular pixels is reduced by 8-11 times. This method can effectively remove the specular pixels in the field of 3D measurement.

关 键 词：三维测量 结构光 反射分量分离 像素填补 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]