嵌入式电子信息系统可靠度优化  

Reliability optimization method for embedded electronic information system

作　　者：白鑫[1,2] 吕丽平[1] 卫琳[2] 

机构地区：[1]郑州升达经贸管理学院信息工程系,郑州451191 [2]郑州大学软件与应用科技学院,郑州450002

出　　处：《沈阳工业大学学报》2017年第4期417-421,共5页Journal of Shenyang University of Technology

基　　金：河南省科技攻关资助项目(162102210121)

摘　　要：针对传统的可靠度优化方法一直存在优化不准确的问题,提出一种新的嵌入式电子信息系统可靠度优化方法.通过分析嵌入式电子信息系统的工作原理,分别对嵌入式电子信息系统故障密度函数、失效率、平均寿命、可用度进行优化,建立嵌入式电子信息系统可靠度约束模型,计算出最优状态下的可靠度参数.测试实验结果证明,采用提出的可靠度优化方法对嵌入式系统进行优化,系统的使用寿命、建模准确度、可用度均有一定的提高,具有一定的实用性.Aiming at the problem that the traditional reliability optimization method always has the inaccurate optimization, a new reliability optimization method for embedded electronic information system was proposed. Through analyzing the working principle of embedded electronic information system, the fault density function, failure rate, average life and availability of embedded electronic information system were optimized, respectively. The reliability constraint model for embedded electronic information system was established, and the reliability parameters under the optimal condition were calculated. The test results show that when the optimization for the embedded system was performed with the reliability optimization method, the service life, modeling accuracy, availability of the system get improved, and the method has definite practicability.

关 键 词：嵌入式 电子信息系统 可靠度优化 计算方法 建模 密度函数 约束模型 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]