基于J750EX测试系统的大容量NOR型FLASH测试方法  

The Investigation of Testing Method for the High-Capacity FLASH of NOR Type Based on the J750EX Measuring System

作　　者：季伟伟 倪晓东 张凯虹[1] 杜元勋[1] 

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《电子与封装》2017年第9期10-14,共5页Electronics & Packaging

摘　　要：NOR型FLASH存储器因其技术显著的高可靠性、能长久存储代码数据的非易失性(Non-Volatile)特点,在关注可靠性胜过性价比的军工和航空航天领域应用十分广泛。但由于此类器件在线编程及擦除操作较繁琐,从而使得利用自动测试系统对其进行测试具有较高难度。因此,探索NOR型FLASH存储器的测试技术,并开发此类器件的测试平台具有十分重要的意义。首先以MICRON公司的PC28F00AM29EW为例,介绍了NOR型FLASH存储器的基本工作原理,接着详细阐述了一种采用J750EX测试系统的DSIO模块结合FLASH分块操作的测试方法,从而能够更简便、高效地对NOR型FLASH存储器的功能进行评价。As the technology is remarkably high reliability, and Non-Volatile that can store code data for a long time, flash memory of NOR type is widely used in the military field and aerospace industry where focusing on reliability over cost performance. However, as it＇s difficult for this device to program and erase online, which make it harder to test with the automatic test system. So it＇s of great significance to explore the testing technology of FLASH memory of NOR type, and develop the platform of such devices. Firstly, taking the PC28F00AM29EW （MICRON, Inc.） as an example, we introduce the basic working principle of NOR flash memory, and then expatiate detailedly on the method of combining flash block operation with the DSIO module of J750EX system. Thus we can evaluate the function of flash memory of NOR type more conveniently and efficiently.

关 键 词：NOR型FLASH DSIO J750EX 

分 类 号：TN307[电子电信—物理电子学]