一种考虑温度和电压的超级电容寿命预测方法  

Life prediction method of supercapacitor for considering temperature and voltage

作　　者：吴立锋[1] 单金生[1] 关永[1] 王洪民 

机构地区：[1]首都师范大学信息工程学院高可靠嵌入式系统技术北京市工程研究中心电子系统可靠性技术北京市重点实验室,北京100048

出　　处：《电源技术》2018年第1期90-92,96,共4页Chinese Journal of Power Sources

基　　金：国家自然科学基金资助项目(61202027);国际科技合作项目资助(2012DFA11340);北京市属高等学校创新团队建设与教师职业发展计划项目(IDHT20150507)

摘　　要：介绍了超级电容的退化特征,阐释了影响其寿命衰减的因素,比较了各因素在超级电容退化过程中的作用,重点阐述了退化因素中环境温度和使用电压对超级电容寿命的影响。提出了基于现有的寿命数据或者经验法则,对工作在不同温度和电压下的超级电容寿命的预测方法,并把这种方法应用于对超级电容退化特征参数的预测,为超级电容的合理使用提供参考依据。The degradation characteristics of the supercapacitor were described, the factors that affect its life were explained, and the role of the factors in the degradation process of the supercapacitor was compared. Among the degradation factors, the influence of the temperature and voltage on supercapacitor life was expounded. The life prediction method of the supercapacitor under different temperature and voltages was proposed based on existing life data or experience rules. This method can be applied for the prediction of the supercapacitor degradation characteristic parameters, which provides reference for the rational use of the supercapacitor.

关 键 词：超级电容 退化 寿命 预测 

分 类 号：TM53[电气工程—电器]