X射线荧光光谱分析测定环境空气中无机元素  

Determination of inorganic elements in particulate matter by wavelength dispersive X-ray fluorescence spectrometry

作　　者：高捷[1] 盛成[1] 申如香[1] 钱荣[1] 王群[1] 卓尚军[1] GAO Jie;SHENG Cheng;SHEN Ru-xiang;QIAN Rong;WANG Qun;ZHUO Shang-jun(Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 20005)

机构地区：[1]中国科学院上海硅酸盐研究所无机材料分析测试中心,上海200050

出　　处：《分析试验室》2018年第7期809-812,共4页Chinese Journal of Analysis Laboratory

基　　金：国家大型科学仪器中心平台;上海市无机非金属材料分析测试专业技术服务平台(14DZ2292900);国家重大科学仪器设备开发专项(2012YQ050076)资助

摘　　要：无需麦拉膜或聚丙烯膜覆盖在空气滤膜样品表面,使用普通液体杯、氦气介质下就可直接用WDXRF测量环境空气中的无机元素。用建立的方法测定了大气颗粒物标准膜样品NIST SRM2783,测定出的元素结果与标准值的相对标准偏差最大仅为4.1%。用建立的方法测定了4个实际滤膜样品中的Na,M g,Al,Si,P,S,K,Ca,Ti,V,Cr,M n,Fe,Cu,Zn,Ba,Pb元素,并和等离子体质谱(ICP-MS)、等离子体光谱(ICP-OES)的结果比较,结果显示本方法可靠,能够满足目前的监测需求和广泛使用。Wavelength dispersive X-ray fluorescence spectrometry has been developed for 17 kinds of inorganic elements analysis in particulate matter without mylar or polypropylene film in helium medium. The certified reference materials NIST SRM2783 was employed for the quantitative determination of Na,Mg,Al,Si,P,S,K,Ca,Ti,V,Cr,Mn,Fe,Cu,Zn,Ba and Pb. The maximum standard of relative standard deviation of the NIST SRM2783 was 4. 1%. Four particulate matter samples were then measured by WDXRF and ICP-MS（ OES） simultaneously. The comparison of results demonstrated that WDXRF can be used as a fast,simple and reliable method for screening the inorganic elements in atmosphere. which meet the requirement of environmental monitoring and wide applications.

关 键 词：X射线荧光光谱 空气滤膜 无机元素 NIST SRM2783 

分 类 号：X132[环境科学与工程—环境科学]