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作 者:王斌[1] 王之哲 陈思 周帅[1] 王小强[1] WANG Bin;WANG Zhizhe;CHEN Si;ZHOU Shuai;WANG Xiaoqiang(The Fifth Institute of Electronics of Ministry of Industry and Information Technology,Guangzhou 510610,China)
机构地区:[1]工业和信息化部电子第五研究所,广东广州510610
出 处:《电子元件与材料》2018年第6期89-92,共4页Electronic Components And Materials
基 金:国家重点研发计划资助(2017YFB0503200);广州市产学研协同创新重大专项资助(201604046021)
摘 要:IGBT模块内部的界面缺陷会影响其热传导,导致模块失效,是影响IGBT模块可靠性的重要因素之一。在常用的缺陷检测方法中,超声检测与制样镜检、X射线检查等技术相比,具有定位准确、检测灵敏度高、成本低、检测速度快、不损伤样品等优势,能够有效探测样品内部任意部位的各种缺陷(如分层、空洞等),对元器件的可靠性评估有着重要的意义。本文将超声检测技术应用于IGBT模块的可靠性评估,从IGBT模块的热失效机理出发,通过利用逐层超声检测技术分析模块内部各界面的工艺质量,实现对IGBT模块内部界面缺陷的有效检测,准确找到IGBT模块材料、工艺中出现的问题,为研制单位的工艺改进提供借鉴,对IGBT模块质量提升具有一定的指导意义。The thermal conduction in the IGBT modules can be affected by the interface defects,resulting in the thermal failure of the modules. It is one of the important factors for the reliability of IGBT modules. Compared with X-ray inspection and sample preparation microscopy technique,the acoustic inspection technology has the advantage of high accuracy,high sensitivity,lowcost,high speed and nondestructivity,which can be used to detect the different internal defects such as delamination and void. It is important for the evaluation of the electronic component reliability. Thus the acoustic inspection technology was applied to the evaluation of IGBT reliability in this paper. The interface defects in the IGBT modules were inspected by applying the layer-by-layer acoustic inspection technology to analyse the process quality of the interfaces,which was helpful for finding problems in the materials or process of the IGBT modules. It is not only instructive for the process improvement of enterprises,but also significant for the improvement of the IGBT quality.
关 键 词:IGBT模块 可靠性 超声检测 界面缺陷 分层 空洞
分 类 号:TN606[电子电信—电路与系统]
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