基于March C+算法的RAM内建自测试设计  

RAM BIST Design Based on March C+ Algorithm

作　　者：刘兴辉[1] 孙守英 程宇 LIU Xing-hui;SUN Shou-ying;CHENG Yu(School of Physics,Liaoning University;Beijing Hong Si Electronic Technology Co.Ltd,Beijing 100029,China)

机构地区：[1]辽宁大学物理学院,沈阳110036 [2]北京宏思电子科技有限公司,北京100029

出　　处：《辽宁大学学报（自然科学版）》2018年第2期125-128,共4页Journal of Liaoning University：Natural Sciences Edition

基　　金：辽宁省教育厅研究生教育教学改革项目(辽教函[2017]24号)

摘　　要：为解决HSC32K1芯片传统测试的不足,基于March C+算法的内建自测试(Built In Self Test,BIST)方法,并利用perl语言调用Mbist Architect工具自动产生March C+算法,生成时间只需要3.5 s,相比手动编写算法代码几十分钟甚至几小时来说缩短了测试时间,提高了测试效率。仿真结果表明,提出的测试方法,可以有效地达到测试效果。该方法可以推广到对其他芯片进行测试,适用性强.In order to solve the shortcomings of traditional test in HSC32 K1 chip,this paper adopts Built In Self Test（ BIST） method based on March C ＋ algorithm,and calls Mbist Architect tool with perl language. The March C ＋ algorithm is automatically generated. The generation time is only 3. 5 seconds,which shortens the test time and improves the test efficiency compared to manually writing the algorithm code for scores of minutes or even hours. Simulation results showthat the test method proposed in this paper can effectively achieve the test results. This method can be extended to other chips testand has strong applicability.

关 键 词：PERL语言 MARCH C+算法 HSC32K1芯片 内建自测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]