卫星典型电子设备单粒子防护效果试验验证  

Test validation for typical satellite electronic device against single event effects

作　　者：张立东 王雷[1] 马平鑫 杨青 ZHANG Lidong;WANG Lei;MA Pingxin;YANG Qing(Institute of Telecommunication Satellite,China Academy of Space Technology,Beijing 100094,China;Shandong Institute of Space Electronic Technology,Yantai 264000,China)

机构地区：[1]中国空间技术研究院通信卫星事业部,北京100094 [2]山东航天电子技术研究所,烟台264000

出　　处：《航天器环境工程》2018年第3期252-257,共6页Spacecraft Environment Engineering

摘　　要：文章通过在卫星电子设备整机上开展单粒子试验验证的案例,揭示单粒子事件对卫星软件指令的影响。试验对象选取卫星平台中典型的电子设备——测控单元,它包含处理器、SRAM等单粒子敏感器件。本案例成功实现在整机状态下触发单粒子事件,测控单元发生单粒子事件的频度疏密适当,验证了测控单元抗单粒子设计的有效性,掌握了测控单元在发生单粒子事件时的工作状态,对漏指令、误指令的产生条件进行了试验验证,并依据试验数据计算了由单粒子事件引发卫星漏指令、误指令的概率。试验结果可为卫星在轨故障分析提供依据,也可为抗单粒子设计提供数据支持。This paper considers a case of single event impinging the RTU, one of the most vulnerable device on the satellite, to show the influence of the single particle event on the satellite commands. The RTU, as a typical electronic device on the satellite, contains the SEE sensible components such as the processor and the SRAM. In this case, the single particle events are successfully enacted in the working state of the RTU in an appropriate rate. The working state of the RTU under single particle event attack is obtained, and the effectiveness of the RTU＇s anti-SEE design is well verified. The rate of command loss and command error is calculated from the test data. The result is helpful for analyzing the inflight faults and the anti single particle design.

关 键 词：卫星电子器件 测控单元 单粒子效应 指令错误 试验验证 

分 类 号：TN609[电子电信—电路与系统] V520.6[航空宇航科学与技术—人机与环境工程]