基于ATE的FPGA测试技术研究和应用  

Research and Application of FPGA Testing Technology Based on ATE

作　　者：王华 WANG Hua(Sino IC Technology Co.,Ltd.,Shanghai 201203,China)

机构地区：[1]上海华岭集成电路技术股份有限公司,上海201203

出　　处：《电子与封装》2018年第7期12-15,21,共5页Electronics & Packaging

摘　　要：随着集成电路技术的高速发展,基于可编程互连资源的现场可编程门阵列(FPGA)器件的应用越来越广泛,FPGA区别于ASIC器件的重要特征是可以实现在制造后重新编程为所需的应用或功能要求。随着FPGA的规模不断扩大,对其故障检测、可靠性验证的要求也越来越高。介绍了FPGA在自动测试设备(ATE)上的测试流程,详细介绍了如何通过硬件设计和软件方法在Advantest公司V93000自动测试设备上实现最大矢量深度扩展,最后通过Virtex-4 FPGA实际实施案例验证了该方案。With the development of integrated circuit technology, the application of field programmable gate array devices based on programmable interconnection resources is more and more widely. The important feature of FPGA is different from ASIC device. It can be realized after re-programming required application or functional requirements. With the scale of FPGA continues to expand, its fault detection, reliability requirements are getting higher and higher. This paper introduces the FPGA test flow of the automatic test equipment（ATE）, and introduces how to realize the maximum vector depth in the Advantest V93000 through hardware and software extended, and finally through Virtex-4 FPGA actual implementation of the case to verify the program.

关 键 词：FPGA测试 ATE 配置矢量 激励矢量 自动测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]