催化剂原位表征进展  

Advancements of in situ characterization of catalysts

作　　者：沈菊李[1] 史鸿鑫[1] 国海光[1] 刘化章[1] 

机构地区：[1]浙江工业大学化工学院,浙江杭州310032

出　　处：《浙江工业大学学报》2002年第5期505-510,共6页Journal of Zhejiang University of Technology

摘　　要：评述了催化剂原位表征的进展和应用。回顾了第 1 2届国际催化会议上有关原位表征的研究结果 ,阐明了原位研究对催化剂的研究和开发的重要性。分原位FT IR、原位XAFS、“原位”XPS、联合原位表征技术及新的原位表征技术五个方面概述了原位表征的最新研究进展。原位FT IR在催化剂原位表征仍占主导地位 ,是获取催化剂表面上反应物、中间体和产物结构和浓度信息的一种有力手段。原位XAFS富含化学和结构信息。讨论了“原位”XPS的实施方法和运用。介绍了三种新的原位表征技术 :流出物响应分析、镜样分析、高温高压下的原位STM研究。The advancements and application of in situ characterization of catalysts are presented.It lays emphasis on the importance of in situ characterization in the research and development of catalysts as was confirmed in the recent international congress on catalysis. Five aspects:in situ FT\|IR,in situ XAFS, 'in situ' XPS,combined in situ techniques and new in situ techniques,are summarized to elucidate the latest advancements of in situ characterization. In situ FT\|IR remains the most widely used in situ technique for catalyst characterization and is one of the most powerful techniques for obtaining information about the structure and concentration of reactants,intermediates and products at the surface of the catalysts. In situ XAFS is rich in chemical and structural information.The realizaion and application of 'in situ' XPS are discussed here.In addition,three new in situ techniques\|flux response analysis,reflected\|sample analysis and STM under high pressure and high temperature\|are introduced.

关 键 词：催化剂 原位表征 联合原位表征技术 

分 类 号：O643.36[理学—物理化学]